I-1 T. Wroblewski - An X-ray camera
I-2 L.-C. Duda - Magnetic circular dichroism in X-ray fluorescence
I-3 J. Grochowski - Single crystal structure analysis using classic and synchrotron radiation sources
I-4 J. Kanski - Surface studies by photoelectron spectroscopy using synchrotron radiation
I-5 J. Lemmerich - Wilhelm Konrad-Roentgen - his life and work
I-6 R. Barrett, J. Baruchel, J. Härtwig and F. Zontone - X-ray diffraction topography at third generation synchrotron radiation facilities.
I-7 K. Ławniczak-Jabłońska, R.J. Iwanowski and Z. Gołacki - Local structure of ZnS and ZnSe doped by Mn, Fe, Co and Ni
I-8 M. Zimnal-Starnawska - Optical properties of AII-BVI semiconducting compounds with transition metals in the 1-25 eV energy range
I-9 B.A. Orłowski, B.J. Kowalski and R.L. Johnson - Resonant photoemission spectroscopy using synchrotron radiation
I-10 J. Krzywiński - Free-electron lasers - towards coherent X-rays
I-11 K. Godwod - Application of X-rays and synchrotron radiation to investigation of the bone structure and density
I-12 T. Chassé - Photoelectron spectroscopy at synchrotron radiation sources in modern chemistry - selected problems

O-13 A. Burian - Determination of partial structure factors for amorphous CdAs films by anomalous wide angle x-ray scattering using synchrotron radiation
O-14 I. Tilinin - Angular distribution of signal photoelectrons ejected from solids by polarized X-rays
O-15 F.N. Chukhovskii, C. Malgrange and J. Gronkowski - X-ray standing waves in crystals
distorted by a constant strain gradient. A theoretical study
O-16 A. Kuczumow - Principles and application of X-ray capillary optics

P-17 W. Chabros, Z. Kraska, S. Jabłoński, P. Parys, L. Rys and E. Woryna - Zastosowanie transmisyjnej siatki dyfrakcyjne wykonanej techniką holograficzną do rentgenowskiej diagnostyki plazmy laserowej (Application of transmission diffraction grating fabricated by holographic technique to X-ray diagnostics of laser plasma)
P-18 H. Grigoriew and M. Jachimowicz - The process of the mechanical nanocrystallization of amorphous Fe78B13Si9 alloy
P-19 J. Grochowski and P. Serda - Improved procedure for measuring surface diffraction on a single crystal diffractometer
P-20 W. Paszkowicz, J. Domagała and Z. Gołacki - X-ray characterization of Zn1-xCoxS single crystals grown by chemical vapour transport
P-21 W. Paszkowicz, Z. Spolnik and Z.R. Żytkiewicz -Rietveld refinement of Ga1-xAlxAs prepared by electroepitaxy
P-22 J. Auleytner, J. Morawiec, V. Khrupa, L. Datsenko and M. Skorokhod - X-ray and TEM investigation of implanted Si crystal subjected to pulsed laser annealing
P-23 J. Bąk-Misiuk, J. Härtwig, M. Leszczyński, A. Misiuk and E. Prieur - Topography of pressure treated Czochralski grown Si and AlxGa1-xAs/GaAs single crystals made at the ESRF
P-24 J. Borowski - Calculations of section topographs with the use of Bessel functions
P-25 K. Wieteska, W. Wierzchowski and W. Graeff - Synchrotron section topography of implanted layers
P-26 D. Żymierska - Calculation of grazing incidence X-ray reflectivity for different wavelength and surface roughness of silicon single crystals
P-27 D. Klinger and J. Auleytner - Symulacja rozkładu czasowego temperatury w amorficznej warstwie powierzchniowej monokryształu krzemu poddanego działaniu impulsowego promieniowania lasera ekscymerowego XeCl o długosci fali 308 nm (Simulation of temperture dependce on time in an amorphous surface layer of a silicon single crystal submitted to pulsed radiation of an excimer 308 nm laser)
P-28 V.S. Goroshkov, A.V. Nedolya and E.G. Noda - High resolution Compton scattering studies in transition metals
P-29 E. Żukowski, M.J. Cooper, P. Lawson, D.N. Timms, F. Itoh and M. Ito - Magnetic Compton profiles of ferrimagnetic CeFe2 and UFe2
P-30 J. Pełka, S. Lagomarsino, A. Cedola, S. Di Fonzo, W. Jark, B. Muller and J. Domagała - Secondary effects excited by standing waves in X-ray waveguide layers
P-31 I.I. Mirenskaya, N.I. Shevtsov and A.B. Blank - Stoichiometry control of high-melting oxide systems using X-ray fluorescence analysis
P-32 D. Dębowska, M. Zimnal-Starnawska, A. Hołda, R. Markowski and A. Kisiel - Electronic structure of zincblende Zn1-xVxSe: experimental study
P-33 M. Radecka, M. Rękas, K. Ferfecki and K. Zakrzewska - Semiconducting properties of TiO2-SnO2 thin films
P-34 R. Markowski, A. Hołda, D. Dębowska, A. Kisiel, M. Zimnal-Starnawska, M. Piacetini, N.Zema and F.Lama - Electronic structure of zincblende Zn0.5V0.5 Se: theoretical study
P-35 E. Guziewicz, B.J. Kowalski, K. Szamota-Sadowska, W. Szuszkiewicz, B. Witkowska and B.A. Orłowski - Vacuum reflectivity study of cubic Hg1-xFexS and HgSe1-ySy
P-36 A. Kołodziejczyk, R. Zimmermann, P. Steiner, M. Hapke, Z. Kąkol, S. Hüfner and J.M.M. Honig - Photoemission satellites, exchange splitting and electronic structure of iron oxides
P-37 B.J. Kowalski, B.A. Orłowski and R.L. Johnson - Resonant photoemission study of Sn1-xMnxTe
P-38 J. Onsgaard, S.V. Christensen, P.J. Godowski, J. Storm, J. Nerlov and M.E. Jorgensen- Investigation of CO/K/Cu(110) and CO2/K/Cu(110) interface by photoemission spectroscopy using synchrotron radiation
P-39 J.W. Sobczak, B. Lesiak, A. Kosiński and W. Palczewska - Study on platinum metals modified polyaniline as novel hydrogenation catalysts
P-40 R. Iwanowski and K. Ławniczak-Jabłońska - Local atomic structure of Zn1-xMnxS diluted magnetic semiconductors: an EXAFS study
P-41 A. Kisiel, E. Czarnecka-Such, P.M. Lee E. Burattini and W. Giriat - X-ray absorption near-edge structure analysis of ZnCoSe: experimental and theoretical studies
P-42 E. Sobczak, P. Byszewski and A. Traverse - Fe K-edge XANES studies of Fe intercalated fullerides
P-43 J. Łażewski, M. Zimnal-Starnawska, A. Kisiel, F. Boscherini, S. Pascarelli and W. Giriat - Ka sulphur edge in Zn1-xMnxS - EXAFS data analysis
P-44 Z. Spolnik and K. Ławniczak-Jabłońska - X- ray emission spectra from ZnS doped by Co
P-45 R. Nietubyć - Model calculations of EXAFS for silicon nitride
P-46 E. Sobczak, Y. Swilem, R. Nietubyć, A. Ślawska-Waniewska and A. Traverse - XANES studies of Fe-base amorphous and nanocrystalline alloys by using synchrotron radiation
P-47 H. Fiedorowicz - Lasery rentgenowskie (X-ray lasers)
P-48 A. Bartnik and K. Jach - Źródło miękkiego promieniowanuia rentgenowskiego wykorzystujące silnoprądowe wyładowanie elektryczne (Source of soft X-rays produced by high-current electric discharge)
P-49 M. Wołcyrz and A. Pietraszko - Synchrotronowe i konwencjonalne dyfrakcyjne badania proszkowe faz typu BiRESr2O6 (RE = lantanowce). Porównanie metod. [Synchrotron and conventional powder diffraction studies of BiRESr2O6 phases (RE=lanthanides). Comparison of the methods)